Professor Cornelia Rodenburg (née Schönjahn) (she/her)

Dipl. Ing (FH), PhD

School of Chemical, Materials and Biological Engineering

Chair in Nanostructured Materials Technology

Dr Cornelia Rodenburg
Profile picture of Dr Cornelia Rodenburg
c.rodenburg@sheffield.ac.uk
+44 114 222 5921

Full contact details

Professor Cornelia Rodenburg (née Schönjahn)
School of Chemical, Materials and Biological Engineering
Sir Robert Hadfield Building
Mappin Street
Sheffield
S1 3JD
Profile

Professor Rodenburg obtained her first Degree in Engineering in Germany in 1997 and her PhD from Sheffield Hallam University in 2001. She joined the Department of Materials Science & Metallurgy at the University in Cambridge as a postdoctoral researcher before moving to the Department of Materials Science & Engineering at the University of Sheffield.

She was awarded a Royal Society Dorothy Hodgkin Fellowship and after a brief spell as University teacher, held an EPSRC Early Career Fellowship (2016-2021). She was Senior Lecturer in Materials Science & Engineering prior to her appointment as Chair in Nanostructured Materials Technology in 2022.

Research interests
  • Low voltage Scanning Electron Microscopy and Secondary Electron Hyperspectral Imaging, with a particular interest in nanostructures in natural materials, biopolymers and related composites
  • Plasmas with particular interest to application to composite manufacture and characterisation  
Publications

Journal articles

  • Zhang J, Farr NTH, Nohl J, Lai Y, Abrams KJ, Black K, Willmott J, Rodenburg C & Mihaylova L (2025) . IEEE Access, 13, 173976-174000.
  • Gao W, Cheng Z, Gregory DA, Knight AJ, Tartakovskii AI, Rodenburg C, Farr NTH & Claeyssens F (2025) . Journal of Colloid and Interface Science, 700(Part 3).
  • Nohl JF, Farr NTH, Acocella MR, Knight AJ, Hughes GM, Zhang J, Robertson S, Micklethwaite S, Murphy S, Motlová T , Walker C et al (2025) . Advanced Science.
  • Elghazy E, Davies MMJ, Farr NTH, Rodenburg C, Willmott JR & Pandhal J (2025) . Journal of CO2 Utilization, 92.
  • Sengokmen-Ozsoz N, Boston R, Dean JS, Rodenburg C & Claeyssens F (2025) . Carbon, 234.
  • Nohl J, Zhang J, Mihaylova L, Cussen S & Rodenburg C (2024) . BIO Web of Conferences, 129.
  • Farr NTH, Gregory DA, Workman VL, Rauert C, Roman S, Knight AJ, Bullock AJ, Tartakovskii AI, Thomas KV, Chapple CR , Deprest J et al (2024) . Journal of the Mechanical Behavior of Biomedical Materials, 160.
  • Farr NTH, Workman VL, Chapple CR, MacNeil S & Rodenburg C (2024) . Nature Reviews Urology, 21, 515-516.
  • Farr NTH, Workman VL, Saad S, Roman S, Hearnden V, Chapple CR, Murdoch C, Rodenburg C & MacNeil S (2024) . Biomaterials Advances, 159.
  • Wan Q, Farr NTH, Li P, Batey D, Rau C, Rodenburg J, Lu L, Laity PR, Xu Z, Holland C , Rodenburg C et al (2024) . Small Structures, 5(4).
  • Farr N, Davies M, Nohl J, Abrams KJ, Schäfer J, Lai Y, Gerling T, Stehling N, Mehta D, Zhang J , Mihaylova L et al (2024) . Advanced Science, 11(10).
  • Nohl JF, Farr NTH, Sun Y, Hughes GM, Stehling N, Zhang J, Longman F, Ives G, Pokorná Z, Mika F , Kumar V et al (2023) . Materials Today Advances, 19.
  • Davies M, Hobbs MJ, Nohl J, Davies B, Rodenburg C & Willmott JR (2022) . Scientific Reports, 12(1).
  • Nohl JF, Farr NTH, Sun Y, Hughes GM, Cussen SA & Rodenburg C (2022) . Micron, 156.
  • Hamad SF, Fei T, Hayes SA, Foreman JP & Rodenburg C (2022) . Journal of Composite Materials, 56(6), 889-897.
  • Farr NTH, Roman S, Schäfer J, Quade A, Lester D, Hearnden V, MacNeil S & Rodenburg C (2021) . RSC Advances, 11(55), 34710-34723.
  • Wan Q, Yang M, Hu J, Lei F, Shuai Y, Wang J, Holland C, Rodenburg C & Yang M (2021) . Nature Communications, 12(1).
  • Farr NTH, Hughes GM & Rodenburg C (2021) . Materials, 14(11).
  • Koeppel A, Stehling N, Rodenburg C & Holland C (2021) . Advanced Functional Materials, 31(30).
  • Farr NTH, Hamad S, Gray E, Magazzeni C, Longman F, Armstrong D, Foreman J, Claeyssens F, Green N & Rodenburg C (2021) . Polymer Chemistry, 12(2), 177-182.
  • Tsevas K, Smith JA, Kumar V, Rodenburg C, Fakis M, Mohd Yusoff ARB, Vasilopoulou M, Lidzey DG, Nazeeruddin MK & Dunbar ADF (2021) . Chemistry of Materials, 33(2), 554-566.
  • Farr N, Thanarak J, Schäfer J, Quade A, Claeyssens F, Green N & Rodenburg C (2021) . Advanced Science, 8(4).
  • Fraternali F, Stehling N, Amendola A, Tiban Anrango BA, Holland C & Rodenburg C (2020) . Nanomaterials, 10(8).
  • Zhu C, Hobbs MJ, Masters RC, Rodenburg C & Willmott JR (2020) . IEEE Transactions on Instrumentation and Measurement, 69(7), 4210-4221.
  • Farr N, Pashneh‐Tala S, Stehling N, Claeyssens F, Green N & Rodenburg C (2020) . Macromolecular Rapid Communications, 41(3).
  • Schäfer J, Quade A, Abrams KJ, Sigeneger F, Becker MM, Majewski C & Rodenburg C (2020) . Plasma Processes and Polymers, 17(1).
  • Schäfer J, Quade A, Abrams KJ, Sigeneger F, Becker MM, Majewski C & Rodenburg C (2020) . Plasma Processes and Polymers, 17(1).
  • Abrams KJ, Dapor M, Stehling N, Azzolini M, Kyle SJ, Schäfer JS, Quade A, Mika F, Kratky S, Pokorna Z , Konvalina I et al (2019) . Advanced Science, 6(19).
  • Hamad SF, Farr N, Fei T, Shukor NF, Dean JS, Hayes SA, Foreman JP & Rodenburg C (2019) . Journal of Applied Polymer Science, 136(47).
  • Hamad SF, Stehling N, Hayes SA, Foreman JP & Rodenburg C (2019) . Materials, 12(10).
  • Masters RC, Stehling N, Abrams K, Kumar V, Azzolini M, Pugno N, Dapor M, Huber A, Schäfer P, Lidzey D & Rodenburg C (2019) . Advanced Science, 6(5).
  • Stehling NA, Abrams KJ, Holland C & Rodenburg C (2019) . Frontiers in Materials, 5.
  • Almansoori A, Abrams KJ, Ghali Al-Rubaye AD, Majewski C & Rodenburg C (2019) . Additive Manufacturing, 25, 297-306.
  • Barbe J, Newman M, Lilliu S, Kumar V, Lee HKH, Charbonneau C, Rodenburg C, Lidzey D & Tsoi WC (2018) . Journal of Materials Chemistry A, 6(45), 23010-23018.
  • Kumar V, Barbe J, Schmidt WL, Tsevas K, Ozkan B, Handley CM, Freeman CL, Sinclair DC, Reaney IM, Tsoi WC , Dunbar A et al (2018) . Journal of Materials Chemistry A, 6(46), 23578-23586.
  • Bishop JE, Smith JA, Greenland C, Kumar V, Vaenas N, Game OS, Routledge TJ, Wong-Stringer M, Rodenburg C & Lidzey DG (2018) . ACS Applied Materials and Interfaces, 10(46), 39428-39434.
  • Wong-Stringer M, Game OS, Smith JA, Routledge TJ, Alqurashy BA, Freestone BG, Parnell AJ, Vaenas N, Kumar V, Alawad MOA , Iraqi A et al (2018) . Advanced Energy Materials, 8(24).
  • Almansoori A, Masters R, Abrams K, Schäfer J, Gerling T, Majewski C & Rodenburg C (2018) . Plasma Processes and Polymers, 15(7).
  • Almansoori AMM, Masters R, Abrams K, Schäfer J, Gerling T, Majewski C & Rodenburg C (2018) . Plasma Processes and Polymers, 15(7).
  • Stehling NA, Masters R, Zhou Y, O'Connell R, Holland C, Zhang H & Rodenburg C (2018) . MRS Communications, 8(2), 226-240.
  • Azzolini M, Morresi T, Abrams K, Masters R, Stehling N, Rodenburg C, Pugno NM, Taioli S & Dapor M (2018) . Journal of Physical Chemistry C, 122(18), 10159-10166.
  • Barbé J, Kumar V, Newman M, Lee H, Jain S, Chen H, Charbonneau C, Rodenburg C & Tsoi WC (2018) . Sustainable Energy and Fuels, 4(2), 905-914.
  • Masters R, Zhang Y, Zhou Y, O'Connell R, Zhang H, Lidzey D & Rodenburg C (2018) Cross-sectioning photovoltaic polymer blends with advanced gas-ion microscopy. Microscopy and Analysis, 34(2), 16-18.
  • Dapor M, Masters R, Ross I, Lidzey DG, Pearson AJ, Abril I, Garcia-Molina R, Sharp J, Uncovsky M, Vystavel T , Mika F et al (2018) . Journal of Electron Spectroscopy and Related Phenomena, 222, 95-105.
  • Wan Q, Abrams K, Masters R, Talari ACS, Rehman IU, Claeyssens F, Holland C & Rodenburg C (2017) . Advanced Materials, 29(47).
  • O'Connell R, Chen Y, Zhang H, Zhou Y, Fox D, Maguire P, Wang JJ & Rodenburg C (2017) . Journal of Microscopy, 268(3), 313-320.
  • Schaefer J, Sigeneger F, Sperka J, Rodenburg C & Foest R (2017) . Plasma Physics and Controlled Fusion, 60(1).
  • Almansoori A, Majewski C & Rodenburg C (2017) . JOM: Journal of the Minerals, Metals and Materials Society, 69(11), 2278-2285.
  • Stringer M, Bishop JE, Smith JA, Mohamad DK, Parnell A, Kumar V, Rodenburg C & Lidzey DG (2017) . Journal of Materials Chemistry A, 5(30), 15714-15723.
  • Kumar V, Schmidt WL, Schileo G, Masters RC, Wong-Stringer M, Sinclair DC, Reaney IM, Lidzey D & Rodenburg C (2017) . ACS Omega, 2(5), 2126-2133.
  • Mohamad DK, Freestone B, Masters RC, Reinhardt M, Canning SL, Rodenburg C & Lidzey DG (2017) . Journal of Materials Chemistry C, 5(9), 2352-2359.
  • Masters RC, Wan Q, Zhang Y, Dapor M, Sandu AM, Jiao C, Zhou Y, Zhang H, Lidzey DG & Rodenburg C (2016) . Solar Energy Materials and Solar Cells.
  • Wan Q, Master RC, Lidsey D, Abrams KJ, Dapor M, Plenderleith RA, Rimmer S, Claeyssens F & Rodenburg C (2016) . Ultramicroscopy, 171, 126-138.
  • Fox DS, Maguire P, Zhou Y, Rodenburg C, O’Neill A, Coleman JN & Zhang H (2016) . Nanotechnology, 27(19).
  • Zhou Y, Fox DS, Maguire P, O’Connell R, Masters R, Rodenburg C, Wu H, Dapor M, Chen Y & Zhang H (2016) . Scientific Reports, 6.
  • Barrows AT, Masters R, Pearson AJ, Rodenburg C & Lidzey DG (2016) . Solar Energy Materials and Solar Cells, 144, 600-607.
  • Bracher C, Yi H, Scarratt NW, Masters R, Pearson AJ, Rodenburg C, Iraqi A & Lidzey DG (2015) . Organic Electronics, 27, 266-273.
  • Masters RC, Pearson AJ, Glen TS, Sasam F-C, Li L, Dapor M, Donald AM, Lidzey DG & Rodenburg C (2015) . Nature Communications, 6.
  • Plenderleith RA, Pateman CJ, Rodenburg C, Haycock JW, Claeyssens F, Sammon C & Rimmer S (2015) . Soft Matter, 11(38), 7567-7578.
  • Rodenburg C, Jepson MAE, Boden SA & Bagnall DM (2014) . Journal of Physics Conference Series, 522(1).
  • Rodenburg C, Viswanathan P, Jepson MAE, Liu X & Battaglia G (2014) . Ultramicroscopy, 139, 13-19.
  • Kumar V, Wang H & Rodenburg C (2014) . Organic Electronics, 15(9), 2059-2067.
  • Pearson AJ, Boden SA, Bagnall DM, Lidzey DG & Rodenburg C (2011) . Nano Lett, 11(10), 4275-4281.
  • Rodenburg C, Liu X, Jepson MAE, Boden SA & Brambilla G (2011) . Journal of Non Crystalline Solids, 357(15), 3042-3045.
  • Jepson M, Liu X, Bell D, Ferranti D, Inkson B & Rodenburg C (2011) . Microsc Microanal, 17(4), 637-642.
  • Rodenburg C, Liu X, Jepson MAE, Boden SA & Brambilla G (2011) Surface morphology of silica nanowires at the nanometer scale. Journal of Non-Crystalline Solids.
  • Rodenburg C, Jepson MAE & Bosch E (2010) . Microscopy and Microanalysis, 16(S2), 622-623.
  • Zhou Z, Jepson MAE, Liu X, Rainforth WM & Rodenburg C (2010) . Microscopy and Microanalysis, 16(S2), 602-603.
  • Rodenburg C, Liu X, Jepson MAE, Zhou Z, Rainforth WM & Rodenburg JM (2010) . Ultramicroscopy, 110(9), 1178-1184.
  • Rodenburg C, Jepson MAE, Bosch EGT & Dapor M (2010) . Ultramicroscopy, 110(9), 1185-1191.
  • Rodenburg C, Jepson E, Inkson J, Bosch E, Chee W & Humphreys J (2010) . Journal of Physics Conference Series, 209.
  • Jepson MAE, Inkson BJ, Beanland R, Chee AKW, Humphreys CJ & Rodenburg C (2010) . Journal of Physics Conference Series, 209.
  • Bell DC, Erdman N, Jepson MA, Rodenburg C & Inkson BJ (2009) . Microscopy and Microanalysis, 15(SUPPL. 2), 652-653.
  • Dapor M, Jepson MAE, Inkson BJ & Rodenburg C (2009) . Microsc Microanal, 15(3), 237-243.
  • Jepson MAE, Inkson BJ, Liu X, Scipioni L & Rodenburg C (2009) . Epl, 86(2).
  • Jepson MAE, Inkson BJ, Liu X, Scipioni L & Rodenburg C (2009) . EPL-EUROPHYS LETT, 86(2).
  • Jepson MAE, Inkson BJ, Rodenburg C & Bell DC (2009) . Epl, 85(4).
  • Jepson MAE, Inkson BJ, Rodenburg C & Bell DC (2009) . EPL-EUROPHYS LETT, 85(4).
  • Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) . EPL-EUROPHYS LETT, 82(4).
  • Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) . EPL-EUROPHYS LETT, 82(3).
  • Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) A comprehensive Monte Carlo calculation of dopant contrast in secondary-electron imaging (Europhysics Letters (EPL) (2008) 82 (30006)). Europhysics Letters, 82(4).
  • Chee AKW, Rodenburg C & Humphreys CJ (2007) . MRS Proceedings, 1026.
  • Zhou Z, Rainforth WM, Rodenburg C, Hyatt NC, Lewis DB & Hovsepian PE (2007) . METALL MATER TRANS A, 38A(10), 2464-2478.
  • Rodenburg C & Rainforth WM (2007) . ACTA MATER, 55(7), 2443-2454.
  • Kazemian P, Mentink SAM, Rodenburg C & Humphreys CJ (2007) . Ultramicroscopy, 107(2-3), 140-150.
  • Rodenburg C & Rainforth WM (2006) . J APPL PHYS, 100(11).
  • Kazemian P, Mentink SAM, Rodenburg C & Humphreys CJ (2006) . J APPL PHYS, 100(5).
  • Kazemian P, Twitchett AC, Humphreys CJ & Rodenburg C (2006) . APPL PHYS LETT, 88(21).
  • Rodenburg C, Krzyzanowski M, Beynon JH & Rainforth WM (2004) . MAT SCI ENG A-STRUCT, 386(1-2), 420-427.
  • Rodenburg C, Krzyzanowski M, Beynon JH & Rainforth WM (2004) . Materials Science and Engineering: A, 386(1-2), 420-427.
  • KAZEMIAN P (2004) . Microelectronic Engineering, 73-74, 948-953.
  • Kaestner B, Rodenburg C & Humphreys CJ (2004) Mapping the potential within a nanoscale undoped GaAs region using a scanning electron microscope. Appl. Phys. Lett., 84, 2109-2111.
  • Schonjahn C, Broom RF, Humphreys CJ, Howie A & Mentink SAM (2003) . APPL PHYS LETT, 83(2), 293-295.
  • Schonjahn C, Humphreys CJ & Glick M (2002) . J APPL PHYS, 92(12), 7667-7671.
  • Schönjahn C, Humphreys CJ & Glick M (2002) . Microscopy and Microanalysis, 8(S02), 718-719.
  • Ehiasarian AP, Macak KA, Schönjahn C, New R & Münz WD (2001) Characterization of arc discharge plasmas in the combined steered arc/unbalanced magnetron deposition process. Proceedings Annual Technical Conference Society of Vacuum Coaters, 382-387.
  • Munz WD, Lewis DB, Hovsepian PE, Schonjahn C, Ehiasarian A & Smith IJ (2001) Industrial scale manufactured superlattice hard PVD coatings. SURF ENG, 17(1), 15-27.
  • Münz WD, Schönjahn C, Paritong H & Smith IJ (2000) Hard coatings deposited by combined cathodic arc evaporation and magnetron sputtering (arc bond sputtering : Abs). Vide Science Technique Et Applications, 2000(297), 205-223.
  • Schonjahn C, Lewis DB, Munz WD & Petrov I (2000) Substrate ion etching in combined steered cathodic arc-UBM deposition system: Effects on interface architecture, adhesion, and tool performance. SURFACE ENG, 16(2), 176-180.
  • Game OS, Smith JA, Alanazi TI, Wong-Stringer M, Kumar V, Rodenburg C, Terrill NJ & Lidzey DG () . Journal of Materials Chemistry A, 8(21), 10943-10956.

Book chapters

  • Zhou Z, Doak SS, Grandy DB, Abrams KJ, Rodenburg C, Weston N & Hourston DJ () (pp. 748-749). Wiley

Conference proceedings

  • Zhang J, Nohl J, Farr N, Rodenburg C & Mihaylova L (2024) . BIO Web of Conferences, Vol. 129. Copenhagen, Denmark, 25 August 2024 - 25 August 2024.
  • Nohl J, Farr N, Acocella MR, Cussen S & Rodenburg C (2024) . BIO Web of Conferences, Vol. 129. Copenhagen, Denmark, 25 August 2024 - 25 August 2024.
  • Micklethwaite S, Basnet R, Ma J, Hopper D, Nohl J, Farr N, Rodenburg C & Hondow N (2024) . BIO Web of Conferences, Vol. 129. Copenhagen, Denmark, 25 August 2024 - 25 August 2024.
  • Davies M, Hobbs MJ, Nohl J, Davies B, Rodenburg C & Willmott JR (2024) . Liquid Crystals XXVIII (pp 57-57), 18 August 2024 - 23 August 2024.
  • Liu B, Green N, Rodenburg C & Claeyssens F (2023) Developing Biodegradable Polymer Resins for Additive Manufacturing via a Novel Synthesis Method. TISSUE ENGINEERING PART A, Vol. 29(13-14)
  • Liu B, Green N, Rodenburg C & Claeyssens F (2023) Developing Biodegradable Polymer Resins for Additive Manufacturing via a Novel Synthesis Method. TISSUE ENGINEERING PART A, Vol. 29(13-14)
  • Amendola A, Sigh N, Rodenburg C, Holland C & Fraternali F (2021) . Proceedings of the 8th International Conference on Computational Methods in Structural Dynamics and Earthquake Engineering (COMPDYN 2015) (pp 1834-1839), 28 June 2021 - 30 June 2021.
  • Rodenburg C, Masters R, Abrams K, Dapor M, Kratky S & Mika F (2018) SECONDARY ELECTRON HYPER SPECTRAL IMAGING IN HELIOS NANOLAB - MAPPING MATERIALS PROPERTIES OR ARTEFACTS?. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 68-68)
  • Abrams KJ, Wan Q, Stehling N, Jiao C, Talari A, Rehman I & Rodenburg C (2017) . Physica Status Solidi (C), Vol. 14. Strasbourg, France, 22 May 2017 - 22 May 2017.
  • Hamad SF, Stehling N, Holland C, Foreman JP & Rodenburg C (2017) . Procedia Engineering, Vol. 200. Braga, Portugal, 21 June 2017 - 21 June 2017.
  • Almansoori A, Seabright R, Majewski C & Rodenburg C (2017) . Proceedings of International Conference on Stuctural Nano Composites (NANOSTRUC 2016), Vol. 195. Aberdeen
  • Rodenburg C, Masters R, Lidzey D, Uncovsky M, Vystavel T & Mika F (2016) SECONDARY ELECTRON SPECTROSCOPY AND ENERGY SELECTIVE IMAGING FOR THE ENGINEERING OF CARBON BASED MATERIALS. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 58-59)
  • Wan Q, Plenderleith RA, Dapor M, Rimmer S, Claeyssens F & Rodenburg C (2015) . Journal of Physics: Conference series, Vol. 644
  • Masters RC, Wan Q, Zhou Y, Sandu AM, Dapor M, Zhang H, Lidzey DG & Rodenburg C (2015) . Journal of Physics: Conference Series, Vol. 644(1)
  • Rodenburg C, Pearson A & Boden S (2011)
  • Rodenburg C, Pearson A, Lidzey D & Bagnall D (2011)
  • Jepson MAE, Khan K, Hayward TJ, Inkson BJ & Rodenburg C (2010) . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
  • Inkson BJ, Liu X, Peng Y, Jepson MAE & Rodenburg C (2010) . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
  • Rodenburg C, Jepson MAE, Inkson BJ, Bosch EGT & Humphreys CJ (2010) . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
  • Rodenburg C, Jepson MAE, Inkson BJ & Liu X (2010) . ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2009 (EMAG 2009), Vol. 241
  • Rodenburg C, Jepson MAE, Bosch EGT & Dapor M (2010) ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 59-60)
  • Chee KWA, Rodenburg C & Humphreys CJ (2008) High resolution dopant profiling in the SEM, image widths and surface band-bending - art. no. 012033. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12033-12033)
  • Chee KWA, Rodenburg C & Humphreys CJ (2008) Quantitative Dopant Profiling in the SEM Including Surface States. MICROSCOPY OF SEMICONDUCTING MATERIALS 2007, Vol. 120 (pp 407-410)
  • Kazemian P, Rodenburg C & Humphreys CJ (2004) . MICROELECTRONIC ENGINEERING, Vol. 73-74 (pp 948-953)
  • Kazemian P, Schonjahn C & Humphreys CJ (2003) Quantitative doping contrast profiling of p-n junctions in Si with the scanning electron microscope. MICROSCOPY OF SEMICONDUCTING MATERIALS 2003(180) (pp 593-596)
  • Meidia H, Cullis AG, Schonjahn C, Munz WD & Rodenburg JM (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 209-213)
  • Schonjahn C, Paritong H, Munz WD, Twesten RD & Petrov I (2001) Influence of the interface composition on the corrosion behavior of unbalanced magnetron grown niobium coatings on steel. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 19(4) (pp 1392-1398)
  • Schonjahn C, Ehlasarian AP, Lewis DB, New R, Munz WD, Twesten RD & Petrov I (2001) Optimization of in situ substrate surface treatment in a cathodic arc plasma: A study by TEM and plasma diagnostics. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, Vol. 19(4) (pp 1415-1420)
  • Munz WD, Schonjahn C, Paritong H & Smith IJ (2000) Hard coatings deposited by combined cathodic arc evaporation and magnetron sputtering (arc bond sputtering : ABS). VIDE-SCIENCE TECHNIQUE ET APPLICATIONS, Vol. 55(297) (pp 205-223)
  • Schonjahn C, Donohue LA, Lewis DB, Munz WD, Twesten RD & Petrov I (2000) Enhanced adhesion through local epitaxy of transition-metal nitride coatings on ferritic steel promoted by metal ion etching in a combined cathodic arc/unbalanced magnetron deposition system. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, Vol. 18(4) (pp 1718-1723)
  • Schonjahn C, Bamford M, Donohue LA, Lewis DB, Forder S & Munz WD (2000) The interface between TiAlN hard coatings and steel substrates generated by high energetic Cr+ bombardment. SURFACE & COATINGS TECHNOLOGY, Vol. 125(1-3) (pp 66-70)
  • Schonjahn C, Paritong H, Donohue LA, Munz WD, Twesten RD & Petrov I (1999) Influence of Cr+ and Nb+ substrate sputter cleaning on the formation of Ti1-xAlxN/steel interfaces generated in a combined cathodic arc/unbalanced magnetron deposition system. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 75-78)
  • Alsari A, Zhang J, Farr NTH, Rodenburg C & Mihaylova L () Towards automated materials analysis: multi-scale spatio-spectral approach for registering secondary electron hyperspectral images. Proceedings of the International Conference on Signal Processing Systems (ICSPS 2025). Chengdu, China, 24 October 2025 - 24 October 2025.
  • Nohl JF, Hughes GM, Robertson S, Sun Y, Micklethwaite S, Hondow N, Jepson M, Cussen S & Rodenburg C () . Proceedings of the Microscience Microscopy Congress 2023 incorporating EMAG 2023. Manchester, United Kingdom, 4 July 2023 - 4 July 2023.
  • Dunbar A, Tsevas K, Vasilopoulou M, Nazeeruddin M, Lidzey D & Rodenburg C () . Proceedings of the International Conference on Hybrid and Organic Photovoltaics, 19 May 2022 - 25 May 2022.
  • Barbe J, Tsoi WC, De Rossi F, Dunlop T, Newman M, Lilliu S, Lakhiani H, Lee HKH, Charbonneau C, Rodenburg C , Watson T et al () . Proceedings of the nanoGe International Conference on Perovskite Solar Cells, Photonics and Optoelectronics, 24 February 2019 - 27 February 2019.
  • Barbe J, Kumar V, Newman M, Lee H, Jain S, Chen H, Charbonneau C, Rodenburg C & Tsoi C () . Proceedings of the 2nd Asia-Pacific Hybrid and Organic Photovoltaics, 28 January 2018 - 30 January 2018.

Software, code or databases

  • Stehling N, Chengge J, Abrams K & Rodenburg C .

Datasets

  • Sinclair D, Reaney I, Rodenburg C, Schmidt W, Kumar V, Lidzey D, Wong-Stringer M & Masters R .
  • Wan Q, Masters R, Lidzey D, Abrams K, Dapor M, Plenderleith RA, Rimmer S, Claeyssens F & Rodenburg C .

Preprints

  • DAVIES M, HOBBS MJ, NOHL J, DAVIES B, RODENBURG C & WILLMOTT JR (2022) , Research Square Platform LLC.
  • Kaestner B, Rodenburg C & Humphreys CJ (2004) , arXiv.
Grants

: Secondary Electron Energy Measurement Optimisation for Reliable Manufacturing of Key Materials (EPSRC)

Teaching interests

Nanoscience and Nanomaterials, Electron Microscopy